| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate capable of suppressing generation of false recognition of an alignment mark and excelling at accuracy in identifying position information etc. by an alignment mark, and provide a manufacturing method of the substrate.SOLUTION: A substrate 1 includes an alignment mark 8 detected with a reflection light of a detection light, and a printed portion 9 to which a print for identification is applied, on a main surface of the substrate 1. When a reflection rate in a wavelength region of the detection light at a non-printed portion of the substrate 1 is 100%, a reflection rate at the printed portion 9 in the wavelength region is 40% or more. |
