发明名称 FOREIGN MATTER INSPECTION DEVICE AND FOREIGN MATTER INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To shorten an inspection time and improve the inspection accuracy when an inspection is made of whether foreign matter is mixed in a transparent container.SOLUTION: An image inspection is made of an inspection object, first, and if reliable determination can be made of whether foreign matter is mixed, the inspection result is established as the final inspection result of a foreign matter inspection device, but if reliable determination cannot be made of whether foreign matter is mixed, far-red light inspection is made of the inspection object following the image inspection.
申请公布号 JP2013186075(A) 申请公布日期 2013.09.19
申请号 JP20120053503 申请日期 2012.03.09
申请人 HITACHI INFORMATION & CONTROL SOLUTIONS LTD 发明人 WAKUI KAZUNORI
分类号 G01N21/90;G01N21/35 主分类号 G01N21/90
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