发明名称 Semiconductor device and method for manufacturing the same
摘要 An object is to provide a semiconductor device including a thin film transistor which includes an oxide semiconductor layer and has high electric characteristics. An oxide semiconductor layer including SiOx is used in a channel formation region, and in order to reduce contact resistance with source and drain electrode layers formed using a metal material with low electric resistance, source and drain regions are provided between the source and drain electrode layers and the oxide semiconductor layer including SiOx. The source and drain regions are formed using an oxide semiconductor layer which does not include SiOx or an oxynitride film.
申请公布号 US8492756(B2) 申请公布日期 2013.07.23
申请号 US20100683695 申请日期 2010.01.07
申请人 SAKATA JUNICHIRO;SHIMAZU TAKASHI;OHARA HIROKI;SASAKI TOSHINARI;YAMAZAKI SHUNPEI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SAKATA JUNICHIRO;SHIMAZU TAKASHI;OHARA HIROKI;SASAKI TOSHINARI;YAMAZAKI SHUNPEI
分类号 H01L29/24;H01L21/34;H01L29/22 主分类号 H01L29/24
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