发明名称 Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator
摘要 A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
申请公布号 US8415639(B2) 申请公布日期 2013.04.09
申请号 US201113033612 申请日期 2011.02.24
申请人 OSAWA YOSHIHIRO;OHKUBO KAZUAKI;OTSUKA ELECTRONICS CO., LTD. 发明人 OSAWA YOSHIHIRO;OHKUBO KAZUAKI
分类号 G01J1/58 主分类号 G01J1/58
代理机构 代理人
主权项
地址