发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device, and a substrate processing apparatus are provided to form an electrode which prevents or suppresses the deterioration of a work function and conductivity by high oxidation resistance. CONSTITUTION: A substrate(300) with a gate insulation layer(302) or a capacitor insulation layer is inputted to a processing chamber. A conductive oxide layer(316) including a ZnO layer(312) and a Ga2O3 layer(314) is formed on the substrate. An additive is added to the conductive oxide layer to change a work function of the conductive oxide layer. A conductive oxide layer forming process and an additive adding process are alternatively repeated several times. The substrate with an electrode is outputted from the processing chamber. [Reference numerals] (300) Silicon substrate; (302) Gate insulation layer;
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申请公布号 |
KR20130033301(A) |
申请公布日期 |
2013.04.03 |
申请号 |
KR20120102119 |
申请日期 |
2012.09.14 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
HORII SADAYOSHI;ITATANI HIDEHARU |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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