发明名称 |
ROOM-TEMPERATURE OPERATING DUAL-GATE SINGLE-ELECTRON DEVICE SYSTEM |
摘要 |
PURPOSE: A dual gate single electron device system operating at room temperature is provided to efficiently control the potential of a quantum dot by minimizing the influence of a dual gate on a tunneling barrier. CONSTITUTION: A first dielectric layer with a preset thickness is formed on a buried oxide layer(100). A top silicon layer(200) with a preset thickness is exposed by removing a part of the first dielectric layer and the top silicon layer. An etch mask(400) is formed to partially cover the exposed top silicon layer. A nanoline structure is formed by etching the top silicon layer. A thermal oxide layer(210) is formed on the surface of the top silicon layer using a thermal oxidation process.
|
申请公布号 |
KR20130015255(A) |
申请公布日期 |
2013.02.13 |
申请号 |
KR20110077151 |
申请日期 |
2011.08.02 |
申请人 |
CHOI, JUNG BUM |
发明人 |
CHOI, JUNG BUM;LEE, JONG JIN |
分类号 |
H01L21/335;H01L29/775 |
主分类号 |
H01L21/335 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|