发明名称 |
METHODS OF FORMING RUTILE TITANIUM DIOXIDE AND ASSOCIATED METHODS OF FORMING SEMICONDUCTOR STRUCTURES |
摘要 |
Methods of forming rutile titanium dioxide. The method comprises exposing a transition metal (such as V, Cr, W, Mn, Ru, Os, Rh, Ir, Pt, Ge, Sn, or Pb) to oxygen gas (O2) to oxidize the transition metal. Rutile titanium dioxide is formed over the oxidized transition metal. The rutile titanium dioxide is formed by atomic layer deposition by introducing a gaseous titanium halide precursor and water to the oxidized transition metal. Methods of forming semiconductor structures having rutile titanium dioxide are also disclosed. |
申请公布号 |
WO2012109026(A3) |
申请公布日期 |
2013.01.31 |
申请号 |
WO2012US22766 |
申请日期 |
2012.01.26 |
申请人 |
MICRON TECHNOLOGY, INC.;HUANG, TSAI-YU;BHAT, VISHWANATH;ANTONOV, VASSIL;CARLSON, CHRIS |
发明人 |
HUANG, TSAI-YU;BHAT, VISHWANATH;ANTONOV, VASSIL;CARLSON, CHRIS |
分类号 |
H01L21/31 |
主分类号 |
H01L21/31 |
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地址 |
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