发明名称 METHODS OF FORMING RUTILE TITANIUM DIOXIDE AND ASSOCIATED METHODS OF FORMING SEMICONDUCTOR STRUCTURES
摘要 Methods of forming rutile titanium dioxide. The method comprises exposing a transition metal (such as V, Cr, W, Mn, Ru, Os, Rh, Ir, Pt, Ge, Sn, or Pb) to oxygen gas (O2) to oxidize the transition metal. Rutile titanium dioxide is formed over the oxidized transition metal. The rutile titanium dioxide is formed by atomic layer deposition by introducing a gaseous titanium halide precursor and water to the oxidized transition metal. Methods of forming semiconductor structures having rutile titanium dioxide are also disclosed.
申请公布号 WO2012109026(A3) 申请公布日期 2013.01.31
申请号 WO2012US22766 申请日期 2012.01.26
申请人 MICRON TECHNOLOGY, INC.;HUANG, TSAI-YU;BHAT, VISHWANATH;ANTONOV, VASSIL;CARLSON, CHRIS 发明人 HUANG, TSAI-YU;BHAT, VISHWANATH;ANTONOV, VASSIL;CARLSON, CHRIS
分类号 H01L21/31 主分类号 H01L21/31
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