发明名称 A SUBLANCE SYSTEM HAVING A PROBE ENABLING TO GET GOOD MOLTEN METAL SAMPLE AND THE SAMPLING METHOD WITH THE SUBLANCE SYSTEM
摘要 PURPOSE: A sub-lance system equipped with a probe for gathering a sound sample and a gathering method of the sound sample are provided to reduce the hours and labor costs due to the failure of sample gathering, consumable costs due to the disposal of a probe which has been used during the failure, and etc., thereby reducing the prime costs. CONSTITUTION: A sub-lance system equipped with a probe for gathering a sound sample comprises a probe, a holder(50), and a sub-lance. A holder hole(51) is formed in the holder(50). The holder hole(51) enables a purge of gas to flow inside a sample gathering device(10) through a gap between an external branch pipe(40) and the holder(50). A branch pipe hole(31) is formed in the internal branch pipe(30) of the probe. The branch pipe hole(31) enables the purge gas, which has flowed in a gap between the external branch pipe(40) and the internal branch pipe(30), to flow inside the sample gathering device(10). An upper room hole(11) is formed in the upper room(12) of the sample gathering device(10) for ventilating the purge gas which has flowed inwards. A metal member(20) is formed in contact with the top outer surface of the upper room(12) of the sample gathering device(10). Member holes(21) are formed in the metal member(20), and are denser than the upper room holes(11). The upper room holes(11) and the member holes(21) are partially overlapped to each other.
申请公布号 KR20130003221(A) 申请公布日期 2013.01.09
申请号 KR20110064389 申请日期 2011.06.30
申请人 WOOJIN ELECTRO-NITE INC. 发明人 NA, BYEUNG HWAN;LEE, MAN EOB;HWANG, SEON CHUN;KIM, HYO SANG
分类号 C21C5/46;G01N1/10;G01N33/20 主分类号 C21C5/46
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