| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a probe for a near field optical microscope, in which high resolution and high sensitivity are both achieved, and which allows a minute sample of several nanometers to be observed; and a near field optical microscope using the same. <P>SOLUTION: The probe for a near field optical microscope collects light associated with a sample of several nanometers at a position close to the sample with a distance sufficiently shorter than its wavelength. The probe for a near field optical microscope is formed by arranging two fine wires of a metal or a material similar to the metal having a plasma frequency in a near infrared region to a visible light region, in parallel, tip ends thereof are aligned, and the other ends are opened in a dipole like shape, and connected to an optical fiber or a light guide. <P>COPYRIGHT: (C)2013,JPO&INPIT |
