发明名称 |
ELECTROMAGNETIC WAVE MEASURING DEVICE, MEASURING METHOD, PROGRAM AND RECORDING MEDIUM |
摘要 |
<P>PROBLEM TO BE SOLVED: To test a sample having a laminar structure through a nondestructive test. <P>SOLUTION: An electromagnetic wave measuring device comprises: electromagnetic wave output apparatus 2 which outputs electromagnetic waves with frequencies from equal to or higher than 0.01 THz to equal to or lower than 100 THz toward a measurement object 1 having two or more layers 1a and 1b; electromagnetic wave detection apparatus 4 which detects reflected electromagnetic waves respectively reflected from the two or more layers 1a and 1b; and a layer analysis device 10 which measures the measurement object 1 on the basis of either or both of extreme values I<SB POS="POST">1</SB>and I<SB POS="POST">2</SB>of respective electromagnetic fields of the reflected electromagnetic waves and a time difference Δt<SB POS="POST">1</SB>in timings t<SB POS="POST">0</SB>and t<SB POS="POST">1</SB>when the respective electromagnetic fields have the extreme values of the reflected electromagnetic waves. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012237657(A) |
申请公布日期 |
2012.12.06 |
申请号 |
JP20110106887 |
申请日期 |
2011.05.12 |
申请人 |
ADVANTEST CORP |
发明人 |
KATO HIDESHI;IRISAWA AKIYOSHI |
分类号 |
G01N21/35;G01N21/3563;G01N21/3581;G01N21/3586;G01R29/08 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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