发明名称 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition from a resist pattern having good CD (critical dimension) uniformity and fewer defects can be produced. <P>SOLUTION: The resist composition includes: (A1) a resin having a structural unit expressed by formula (I); (A2) a resin having a structural unit expressed by formula (II), which is insoluble or poorly soluble with an alkali aqueous solution and can dissolve in an alkali aqueous solution by the action of an acid; and (B) an acid generator. In the formulae, R<SP POS="POST">2</SP>represents a hydrocarbon group having a fluorine atom; and ring T<SP POS="POST">1</SP>represents a sultone ring. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012226338(A) 申请公布日期 2012.11.15
申请号 JP20120084449 申请日期 2012.04.03
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;KAMABUCHI AKIRA;KIN KYOCHU
分类号 G03F7/039;C08F20/18;G03F7/004;H01L21/027 主分类号 G03F7/039
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