| 摘要 |
A testing system is used to testing a flip type electronic device having a main body, and a cover. The testing system includes a fixing structure, a flipping structure, a sensing device, a rotating mechanism, and a control device. The fixing structure positions the main body. The fixing structure flips the cover until a rotation degree of the cover and the main body reaches a threshold degree. The sensing device senses is pressed by the cover when the cover automatically rotates relative to the main body and generates electrical pressure signals according to the mount of pressure. The control device controls the rotating mechanism to drive the flipping structure to rotate and judges whether the flipping performance of the electronic device is normal according to the electrical pressure signals. |
