发明名称 |
FLAW DETECTION DEVICE AND FLAW DETECTION METHOD |
摘要 |
Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus (1) including a flaw-detection sensor group (11) in which two flaw-detection sensors (11a and 11b) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device (15) that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (11a and 11b), wherein, with regard to the detection signals detected by the flaw-detection sensors (11a and 11b), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device (15) determines that the detection signals are not defect signals. |
申请公布号 |
EP2518487(A1) |
申请公布日期 |
2012.10.31 |
申请号 |
EP20100839064 |
申请日期 |
2010.10.25 |
申请人 |
MITSUBISHI HEAVY INDUSTRIES, LTD. |
发明人 |
KAWATA, KAYOKO;KUROKAWA, MASAAKI;HIGASHI, MASAYOSHI;TAKATSUGU, MASAYA;ASADA, YOSHIHIRO |
分类号 |
G01N27/90 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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