发明名称 Method and system for forming conductive bumping with copper interconnection
摘要 A method for making an integrated circuit system with one or more copper interconnects that are conductively connected with a substrate includes depositing and patterning a first dielectric layer to form a first via and filling the first via through the first dielectric layer with a copper material. The method further includes depositing and patterning a second dielectric layer in contact with the first dielectric layer to form a second via, and forming a diffusion barrier layer. Moreover, the method includes depositing and patterning a photoresist layer on the diffusion barrier layer, and at least partially filling the second via with a gold material. The gold material is conductively connected to the copper material through the diffusion barrier layer. The method further includes removing the photoresist and the diffusion barrier layer not covering by the gold material. Additionally, the method includes conductively connecting the gold material with the substrate.
申请公布号 US8293635(B2) 申请公布日期 2012.10.23
申请号 US201113269538 申请日期 2011.10.07
申请人 XIAO DE YUAN;CHEN GUO QING;SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 XIAO DE YUAN;CHEN GUO QING
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址