发明名称 DRAM WITH SCHOTTKY BARRIER FET AND MIM TRENCH CAPACITOR
摘要 A semiconductor circuit and method of fabrication is disclosed. In one embodiment, the semiconductor circuit comprises a metal-insulator-metal trench capacitor in a silicon substrate. A field effect transistor is disposed on the silicon substrate adjacent to the metal-insulator-metal trench capacitor, and a silicide region is disposed between the field effect transistor and the metal-insulator-metal trench capacitor. Electrical connectivity between the transistor and capacitor is achieved without the need for a buried strap.
申请公布号 US2012248522(A1) 申请公布日期 2012.10.04
申请号 US201113073103 申请日期 2011.03.28
申请人 GOYAL PUNEET;HO HERBERT LEI;JANA PRADEEP;LIU JIN;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GOYAL PUNEET;HO HERBERT LEI;JANA PRADEEP;LIU JIN
分类号 H01L29/772;H01L21/02 主分类号 H01L29/772
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