发明名称 SUBSTRATE WITH ELECTRODE FOR INSPECTION AND INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate with an electrode for an inspection capable of suppressing size increase of the substrate and generation of poor connection though it is inexpensive and has simple structure, and to assure comprehensive quality after connecting a device at a stage of a simple substance inspection. <P>SOLUTION: The present invention includes: a connection part 2 for mounting a body substrate; connection part 3 for an inspection adjacent to the connection part 2 for mounting the body substrate; a cut-off area 9 provided between the connection part 2 for mounting the body substrate and the connection part 3 for the inspection; and an electrode 7 for connecting the body substrate for linearly connecting a wiring pattern 6 of the connection part 2 for mounting the body substrate with a wiring pattern 6 including an electrode 8 for connecting an inspection substrate of the connection part 3 for the inspection over the cut-off area 9. In addition, the connection part 3 for the inspection is bent, and mounted on the inspection substrate with the same structure as that of the body substrate. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012177567(A) 申请公布日期 2012.09.13
申请号 JP20110039555 申请日期 2011.02.25
申请人 NEC CORP 发明人 ODA KENJI
分类号 G01R31/28 主分类号 G01R31/28
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