| 摘要 |
A three dimensional measurement apparatus includes a projection unit that projects, to a measurement target object, a first pattern light including alternately arranged bright parts and dark parts and a second pattern light in which a phase of the first pattern light is shifted, and an imaging unit that images the measurement target object on which the first or second pattern light is projected. When a period of repetitions of the bright parts and the dark parts of the pattern light is one period, a range of imaging on the measurement target object by one pixel included in the imaging unit is an image distance, and the length of one period of the projected pattern light on the measurement target object surface is M times the image distance, the projection unit and the imaging unit are arranged to satisfy “2×N−0.2≦̸M≦̸2×N+0.2 (where N is not less than 2)”.
|
