发明名称 Semiconductor memory device
摘要 According to one embodiment, a semiconductor memory device includes bit line pairs extending in a column direction, each of the bit line pairs includes a first bit line and a second bit line, and memory cell groups connected to the bit line pairs, respectively, and each includes memory cells. Each of the memory cells comprises a first transistor, a second transistor and a resistive memory element. One end of the resistive memory element is connected to the first bit line. A drain region of the first transistor and a drain region of the second transistor are connected to each other and connected to the other end of the resistive memory element. A source region of the first transistor and a source region of the second transistor are connected to the second bit line.
申请公布号 US8174874(B2) 申请公布日期 2012.05.08
申请号 US20100883019 申请日期 2010.09.15
申请人 INABA TSUNEO;KABUSHIKI KAISHA TOSHIBA 发明人 INABA TSUNEO
分类号 G11C11/00 主分类号 G11C11/00
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