发明名称 PROJECTING PATTERNS FOR HIGH RESOLUTION TEXTURE EXTRACTION
摘要 <p>Camera-based texture extraction in Augmented Reality (AR) systems is enhanced by manipulating projected patterns. One or more fine line patterns are projected onto a textured surface, a Moire interference pattern measured, and different properties of the projected pattern(s) adjusted until the Moire interference pattern measurements indicate that a similar texture pattern to that of the three dimensional target is being projected. Thereby, the target texture may be more closely matched even as sub-pixel resolutions, variable lighting conditions, and/or complicated geometries.</p>
申请公布号 WO2012044300(A1) 申请公布日期 2012.04.05
申请号 WO2010US50863 申请日期 2010.09.30
申请人 EMPIRE TECHNOLOGY DEVELOPMENT LLC;EZEKIEL, KRUGLICK 发明人 EZEKIEL, KRUGLICK
分类号 G01B11/30 主分类号 G01B11/30
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