发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a substrate processing apparatus which improve a deposition rate and film thickness uniformity of a thin film formed on a substrate by enhancing supply of material gasses to the substrate. <P>SOLUTION: The semiconductor manufacturing method comprises: a step of depositing a thin film of a predetermined film thickness on a substrate by performing one or more cycles each including a step of supplying a material gas into a processing chamber in which the substrate is stored and exhausting the material gas through an exhaust duct, and a step of supplying a reaction gas different from the material gas into the processing chamber and exhausting the reaction gas through the exhaust duct. In the step of supplying the material gas, a valve provided on the exhaust duct is temporarily closed fully to temporarily block the exhaust duct immediately before supplying the material gas. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012059997(A) 申请公布日期 2012.03.22
申请号 JP20100203018 申请日期 2010.09.10
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 NAKAMURA YOSHINOBU;SASAJIMA RYOTA;OTA YOSUKE;AKAE HISANORI;TAKAZAWA HIROMASA;HIROSE YOSHIRO
分类号 H01L21/318;C23C16/455;H01L21/31;H01L21/316 主分类号 H01L21/318
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