发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a substrate processing apparatus which improve a deposition rate and film thickness uniformity of a thin film formed on a substrate by enhancing supply of material gasses to the substrate. <P>SOLUTION: The semiconductor manufacturing method comprises: a step of depositing a thin film of a predetermined film thickness on a substrate by performing one or more cycles each including a step of supplying a material gas into a processing chamber in which the substrate is stored and exhausting the material gas through an exhaust duct, and a step of supplying a reaction gas different from the material gas into the processing chamber and exhausting the reaction gas through the exhaust duct. In the step of supplying the material gas, a valve provided on the exhaust duct is temporarily closed fully to temporarily block the exhaust duct immediately before supplying the material gas. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012059997(A) |
申请公布日期 |
2012.03.22 |
申请号 |
JP20100203018 |
申请日期 |
2010.09.10 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
NAKAMURA YOSHINOBU;SASAJIMA RYOTA;OTA YOSUKE;AKAE HISANORI;TAKAZAWA HIROMASA;HIROSE YOSHIRO |
分类号 |
H01L21/318;C23C16/455;H01L21/31;H01L21/316 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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