| 摘要 |
An analysis device (10) is provided with a plasma generation device (11) and a photometric analysis device (13). The plasma generation device (11) energises matter in the air and generates initial plasma in a plasma state, and maintains the plasma state by subjecting the initial plasma to electromagnetic waves over a predetermined period of time. The photometric analysis device (13) analyses matter (15) to be analysed using the time integral of the emission intensity of light emitted from the matter (15) to be analysed within the electromagnetic wave plasma region maintained by the electromagnetic waves. |
