发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to reduce a process time and improve productivity by forming a resistance film having a variable resistance property. CONSTITUTION: In a method for fabricating a semiconductor device, a metal layer is formed on a bottom electrode(21). An oxygen is ion-implanted in the metal layer(101). A thermal process is performed to change a metal layer(22A) into a resistor film. The resistor film comprises a plurality of oxygen vacancies A top electrode is formed on the resistor film.
申请公布号 KR20120004826(A) 申请公布日期 2012.01.13
申请号 KR20100065513 申请日期 2010.07.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JU, MIN AE
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
主权项
地址