发明名称 INTERNAL DISPLAY PORT INTERFACE TEST METHOD AND DEVICE
摘要 An iDP interface test method includes transmitting test clocks to an iDP sink device; determining whether or not a link clock lock operation in the iDP sink device is successful based on a measurement result of an HPD signal when a clock lock operation for the test clocks is performed; transmitting test data and arbitrary video data to the iDP sink device if the link clock lock operation in the iDP sink device is successful; determining whether or not a symbol lock operation in the iDP sink device is successful when the symbol lock operation for the test data and the arbitrary video data is performed; and comparing a count result with a predetermined reference value, and determining link stability of the iDP sink device based on the comparison result.
申请公布号 US2011310252(A1) 申请公布日期 2011.12.22
申请号 US201113157061 申请日期 2011.06.09
申请人 PARK DONGWON;KIM SUNGHOON;KIM SUNGWON;LEE CHONGHO 发明人 PARK DONGWON;KIM SUNGHOON;KIM SUNGWON;LEE CHONGHO
分类号 H04N17/04 主分类号 H04N17/04
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