发明名称 SAMPLING POSITION DETERMINATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a sampling position determination device that avoids occurrence of data bias caused by sampling from a certain position because of the difficulty of choosing a spot representing a target area when collecting samples for sampling. <P>SOLUTION: A target area is specified on an image to extract a feature amount from the target area. The feature amount is clustered in feature amount space to find a representative feature, which is extracted as a sampling spot. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011252870(A) 申请公布日期 2011.12.15
申请号 JP20100128406 申请日期 2010.06.04
申请人 HITACHI SOLUTIONS LTD 发明人 KAZAMA YORIKO;NISHIGUCHI OSAMU;TANIZAKI MASAAKI
分类号 G01N21/27 主分类号 G01N21/27
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