| 摘要 |
An integrated circuit comprises at least first and second frequency generating circuits, wherein each frequency generating circuit comprises a reference frequency source; a voltage controlled oscillator; and a feedback control circuit for controlling the voltage controlled oscillator to provide a desired output frequency signal. The output of the voltage controlled oscillator of the first frequency generating circuit is switched into the feedback control circuit of the second frequency generating circuit to provide a test signal for testing one or more components of the feedback control circuit of the second frequency generating circuit.
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