发明名称 SELF-CALIBRATING TEST SYSTEM
摘要 A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.
申请公布号 US2011270561(A1) 申请公布日期 2011.11.03
申请号 US20100769602 申请日期 2010.04.28
申请人 GREGG JUSTIN;TAKEYA TOMOKI;SYED ADIL 发明人 GREGG JUSTIN;TAKEYA TOMOKI;SYED ADIL
分类号 G06F19/00;G01D18/00 主分类号 G06F19/00
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