PIN CARD AND TEST DEVICE USING SAME

摘要

A first switch (SW1) comprises a first terminal (P1) connected to an AC test unit (30), and a second terminal (P2) connected to an I/O terminal (Pio) and a DC test unit (40). The first switch (SW1) is configured to enable switching between conductive and cut-off states between the first terminal (P1) and the second terminal (P2). A bypass capacitor (C1) is disposed between the first terminal (P1) and the second terminal (P2), and bypasses the frequency component cut off by the first switch (SW1).