发明名称 METAL THIN FILM FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a film deposition method in which the film deposition rate by the sputtering is reduced, a metal thin film with excellent coatability is formed on an inner wall surface and an inner bottom surface of a hole or a groove with the aspect ratio being≥3 formed in a surface of a workpiece, and the self-hold discharge in a target is generated even with small power. SOLUTION: In a step in which the voltage V and the current I are applied to a target 3, introduction of sputtering gas is stopped after discharge is generated from the target within a chamber 2, the self-hold discharge is generated by ions of the target, and a metal thin film is formed on the entire surface of a workpiece including a hole or a groove in the surface of the workpiece W, the current I to be applied to the target is made constant, the voltage V is increased when the discharge becomes unstable, and at the same time, the formulae (1) and (2) are satisfied, where I>I<SB>0</SB>(1) and P>P<SB>0</SB>(2), in which I<SB>0</SB>denotes the minimum value of the current starting the self-hold discharge, P denotes the power of the target, and P<SB>0</SB>denotes the minimum value of the power starting the self-hold discharge. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011179068(A) 申请公布日期 2011.09.15
申请号 JP20100044261 申请日期 2010.03.01
申请人 ULVAC JAPAN LTD 发明人 HAMAGUCHI JUNICHI;KODAIRA SHUJI;KAMATA TSUNEKICHI;SANO AKIFUMI;SAKAMOTO YUTA;OKAMURA YOSHIHIRO;TOYODA SATOSHI
分类号 C23C14/34;H01L21/28;H01L21/285;H01L21/3205;H01L21/768 主分类号 C23C14/34
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