| 摘要 |
To provide an electronic circuit capable of easily testing semiconductor chips that are inductively coupled to each other and that communicate with each other, and an inspection method performed in the electronic circuit. An electronic circuit includes: a first substrate; a first transmission coil that is formed by a wire and transmits a signal; a first transmission circuit that outputs a signal to the first transmission coil; a first reception coil that is formed by a wire at such a position that the first reception coil is inductively coupled to the first transmission coil and receives the signal from the first transmission coil; a first reception circuit that receives the signal from the first reception coil; and a first determination circuit that compares data input to the first transmission circuit and data output from the first reception circuit, the first transmission coil, the first transmission circuit, the first reception coil, the first reception circuit and the first determination circuit being mounted on the first substrate.
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