| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To easily and precisely detect a pulse width of a pulse signal which is generated in a semiconductor device. <P>SOLUTION: An internal pulse waveform conversion circuit 11 disposed on an IC chip 20 generates an internal pulse monitor signal PLSMON that changes in a predetermined direction at the rise timing of an internal pulse signal PLS during a period in which a first enable signal PLS_RISE_EN is enabled and a second enable signal PLS_FALL_ENB is disabled, and then maintains the changed state for a predetermined period of time or longer; and generates the internal pulse monitor signal PLSMON that changes in the predetermined direction at the fall timing of the internal pulse signal PLS during a period in which the first enable signal PLS_RISE_EN is disabled and the second enable signal PLS_FALL_ENB is enabled, and then maintains the changed state for the predetermined period of a time or longer. The generated internal pulse monitor signal PLSMON is outputted to a tester 22 for detecting the pulse width of the internal pulse signal PLS. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
