发明名称 |
CONNECTING DEVICE FOR TESTING ELECTRONIC DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PURPOSE: A connection element inspecting the fault of an electric component and a manufacturing method thereof are provided to simplify a manufacturing process and reduce manufacturing costs by minimizing or eliminating a vacuum etching process. CONSTITUTION: An extension part(101b) is extended from one side end of a supporting part(101a) as narrow width than the supporting part. A plurality of conductive sheets is included of a contact part(101c) formed in the end part of the extension part. A plurality of insulating property thin plates(102) electrically decouples the conductive sheets. |
申请公布号 |
KR20110089482(A) |
申请公布日期 |
2011.08.09 |
申请号 |
KR20100008905 |
申请日期 |
2010.02.01 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
I, DAE GIL;KIM, BYUNG CHUL |
分类号 |
G01R1/073;G01R3/00;H01R33/76 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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