发明名称 CONNECTING DEVICE FOR TESTING ELECTRONIC DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PURPOSE: A connection element inspecting the fault of an electric component and a manufacturing method thereof are provided to simplify a manufacturing process and reduce manufacturing costs by minimizing or eliminating a vacuum etching process. CONSTITUTION: An extension part(101b) is extended from one side end of a supporting part(101a) as narrow width than the supporting part. A plurality of conductive sheets is included of a contact part(101c) formed in the end part of the extension part. A plurality of insulating property thin plates(102) electrically decouples the conductive sheets.
申请公布号 KR20110089482(A) 申请公布日期 2011.08.09
申请号 KR20100008905 申请日期 2010.02.01
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 I, DAE GIL;KIM, BYUNG CHUL
分类号 G01R1/073;G01R3/00;H01R33/76 主分类号 G01R1/073
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