发明名称 High throughput measurement system
摘要 A substrate processing system includes a processing module to process a substrate, a factory interface module configured to accommodate at least one cassette for holding the substrate, a spectrographic monitoring system positioned in or adjoining the factory interface module, and a substrate handler to transfer the substrate between the at least one cassette, the spectrographic monitoring system and the processing module.
申请公布号 US7952708(B2) 申请公布日期 2011.05.31
申请号 US20080059464 申请日期 2008.03.31
申请人 APPLIED MATERIALS, INC. 发明人 RAVID ABRAHAM;SWEDEK BOGUSLAW A.;BENVEGNU DOMINIC J.;DAVID JEFFREY DRUE;QIAN JUN;HUEY SIDNEY P.;CARLSSON INGEMAR;KARUPPIAH LAKSHMANAN;LEE HARRY Q.
分类号 G01J3/40 主分类号 G01J3/40
代理机构 代理人
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