发明名称 |
Method for producing a semiconductor including a foreign material layer |
摘要 |
A method for producing a semiconductor including a material layer. In one embodiment a trench is produced having two opposite sidewalls and a bottom, in a semiconductor body. A foreign material layer is produced on a first one of the two sidewalls of the trench. The trench is filled by epitaxially depositing a semiconductor material onto the second one of the two sidewalls and the bottom of the trench.
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申请公布号 |
US7947569(B2) |
申请公布日期 |
2011.05.24 |
申请号 |
US20080164652 |
申请日期 |
2008.06.30 |
申请人 |
INFINEON TECHNOLOGIES AUSTRIA AG |
发明人 |
MAUDER ANTON;PFIRSCH FRANK;BERGER RUDOLF;SEDLMAIER STEFAN;LEHNERT WOLFGANG;FOERG RAIMUND |
分类号 |
H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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