发明名称 Method for producing a semiconductor including a foreign material layer
摘要 A method for producing a semiconductor including a material layer. In one embodiment a trench is produced having two opposite sidewalls and a bottom, in a semiconductor body. A foreign material layer is produced on a first one of the two sidewalls of the trench. The trench is filled by epitaxially depositing a semiconductor material onto the second one of the two sidewalls and the bottom of the trench.
申请公布号 US7947569(B2) 申请公布日期 2011.05.24
申请号 US20080164652 申请日期 2008.06.30
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 MAUDER ANTON;PFIRSCH FRANK;BERGER RUDOLF;SEDLMAIER STEFAN;LEHNERT WOLFGANG;FOERG RAIMUND
分类号 H01L21/76 主分类号 H01L21/76
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