发明名称 |
OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an oxide semiconductor film having a new structure which is preferably used for a semiconductor device or to provide a semiconductor device using an oxide semiconductor film having the new structure. <P>SOLUTION: An oxide semiconductor film has an amorphous region which is mainly amorphous and a crystal region containing crystal grains of In<SB>2</SB>Ga<SB>2</SB>ZnO<SB>7</SB>in the vicinity of a surface, in which the crystal grains are oriented so that the c-axis is almost vertical with respect to the surface. Alternatively, a semiconductor device uses such an oxide semiconductor film. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011100979(A) |
申请公布日期 |
2011.05.19 |
申请号 |
JP20100221574 |
申请日期 |
2010.09.30 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;SAKAKURA MASAYUKI;MIYANAGA SHOJI;TAKAHASHI MASAHIRO;HIROHASHI TAKUYA;SHIMAZU TAKASHI |
分类号 |
H01L21/20;G02F1/1368;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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