发明名称 METHOD FOR DESIGNING PHOTOMASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for designing a photomask by which accuracy of predicting a dimensional conversion difference can be enhanced. <P>SOLUTION: The method for designing a photomask includes procedures of: obtaining a dimensional conversion difference based on an analysis index relating to the accuracy of predicting a dimensional conversion difference; carrying out a process proximity correction on the design pattern data after processing; and creating an exposure pattern data from the corrected design pattern data. The analysis index is at least one kind selected from a group of indices about a figure of the pattern to be formed, about an occupancy proportion of the pattern with respect to the substrate surface, and about the diffusion property of a gas component in the space where the processing is carried out. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011065112(A) 申请公布日期 2011.03.31
申请号 JP20090218227 申请日期 2009.09.21
申请人 TOSHIBA CORP 发明人 IYANAGI KATSU
分类号 G03F1/36;G03F1/68;G03F1/70;H01L21/027 主分类号 G03F1/36
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