发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of expanding the margin of circuit design. SOLUTION: The semiconductor integrated circuit 100 includes transistors 124a and 124b, a detection circuit 131, and a bias generation circuit 132. A bias is applied to the substrate of the transistors 124a and 124b. The detection circuit 131 detects the threshold voltages of the transistors 124a and 124b. The bias generation circuit 132 generates a bias, based on the detection results from the detection circuit 131. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011049212(A) 申请公布日期 2011.03.10
申请号 JP20090194104 申请日期 2009.08.25
申请人 FUJITSU LTD 发明人 SUGAWARA MARIKO
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/088;H03F1/22;H03F3/45 主分类号 H01L27/04
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