| 摘要 |
A universal spring contact pin for use in an IC test Socket includes a depressible probe member at one end and a fixed probe member at the other end. The fixed probe member preferably has a projection length chosen to allow z-axis loading of different surface mount package types within the same test socket. It also can have a relatively large tip angle which preferably terminates at a relatively sharp termination point. Preferably, the tip angle is about 90 degrees and the radius of the termination point of the tip is about 0.001 inches (0.0254 millimeters) or less. The large tip angle on the contact pin's fixed probe member provides the pin with a robust probe end that operates reliably over a large number of test cycles, is better adapted for effective use with different surface mount chip packages, and better supports a sharp tip radius. A sharp tip radius will, in turn, provide for better penetration of oxide coatings and/or foreign material on the leads of the chip packages. A test socket can be provided for the universal spring contact pins, which can include an interface wall configuration for retaining the contact pins in a z-axis alignment and for improving the signal performance of the socket at high frequencies.
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