发明名称 Group III nitride substrate, epitaxial layer-provided substrate, methods of manufacturing the same, and method of manufacturing semiconductor device
摘要 A group III nitride substrate on which an epitaxially grown layer of good quality can be formed, and a method of manufacturing the same are obtained. A GaN substrate is one of the following: a group III nitride substrate, wherein the number of atoms of an acid material per square centimeter of a surface is not more than 2×1014, and the number of silicon atoms per square centimeter of the surface is not more than 3×1013; a group III nitride substrate, wherein the number of silicon atoms per square centimeter of a surface is not more than 3×1013, and a haze level of the surface is not more than 5 ppm; and a group III nitride substrate, wherein the number of atoms of an acid, material per square centimeter of a surface is not more than 2×1014, and a haze level of the surface is not more than 5 ppm.
申请公布号 US7901960(B2) 申请公布日期 2011.03.08
申请号 US20070445681 申请日期 2007.10.09
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ISHIBASHI KEIJI;HACHIGO AKIHIRO;IRIKURA MASATO;NAKAHATA SEIJI
分类号 H01L21/00;H01L33/16;H01L33/32 主分类号 H01L21/00
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