| 摘要 |
The present invention relates to a level shifter circuit (20) for transistors requiring high voltage, such as nonvolatile memories. In the circuit configuration, the drain- to-source voltage across the NMOS transistors (Q1, Q4) can be substantially equal to the power supply voltage (VPP) according to the input voltage level at the complementary input terminals (IN, INB). For alleviating such a voltage stress, the source potential of each NMOS transistor is increased according to the input voltage level. Thus, the source of the transistor at the OUT side is biased by the input signal at the input terminal (IN) and the source of the transistor at the IN side is biased by the complementary input signal at the corresponding terminal (INB). Hot-carrier degradation and leakage of the load current flowing through from the power supply voltage (VPP) to the reference voltage (VSS) can be then reduced.
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