发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of generating a negative voltage of high precision in a programmable manner. SOLUTION: A negative voltage detection circuit which controls an output voltage VPW of a negative voltage generation device includes a changeover switch TG for changing detection values of a negative voltage, and a correction switch TB. The correction switch has the same constitution with the changeover switch, and is held in an ON state. Thus, an influence of ON resistance of the changeover switch can be canceled. Consequently, the negative voltage of high precision can be generated in the programmable manner. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011029417(A) 申请公布日期 2011.02.10
申请号 JP20090173814 申请日期 2009.07.27
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 OGAWA KAZUKI
分类号 H01L21/822;G05F1/10;H01L27/04 主分类号 H01L21/822
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