| 摘要 |
A semiconductor memory device includes a mask information storage circuit that stores therein mask information indicating an area for which the self refresh operation is not performed among a plurality of areas in a memory cell array, a mask determining circuit that is activated by a self refresh command and generates a match signal in response to a detection of a match between a refresh address and the mask information, and a refresh operation control circuit that disables the self refresh operation in response to an activation of the match signal. When a test mode signal is activated, the mask determining circuit is also activated by the auto refresh command. With this configuration, it is possible to perform a test of a partial array self refresh function without actually entering a self refresh mode.
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