Burn-in test circuit, burn-in test method, burn-in test apparatus, and a burn-in test pattern generation program product

摘要

A burn-in test circuit according to the present invention includes a scan chain formed by a plurality of scan flip-flips connected in series, a circuit under test input with an output from one of the plurality of scan flip-flops as an activation signal, and a scan chain loop circuit being configured to an output signal of the scan chain determined according to an output of the circuit under test back to the scan chain.