发明名称 Film forming method for dielectric film
摘要 The present invention is a film forming method for an SiOCH film, comprising a unit-film-forming step including: a deposition step of depositing an SiOCH film element by using an organic silicon compound as a raw material and by using a plasma CVD method; and a hydrogen plasma processing step of providing a hydrogen plasma process to the deposited SiOCH film element, wherein the unit-film-forming step is repeated several times so as to form an SiOCH film on a substrate.
申请公布号 US7867922(B2) 申请公布日期 2011.01.11
申请号 US20060086030 申请日期 2006.12.05
申请人 TOKYO ELECTRON LIMITED 发明人 IDE SHINJI;OSHIMA YASUHIRO;KASHIWAGI YUSAKU
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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