发明名称 FUSE OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: The fuse of a semiconductor device and a method for forming the same are provided to prevent the generation of blowing damages on a peripheral fuse by regulating the widths and the thicknesses of the fuse. CONSTITUTION: A lower anti-reflective film(33) is formed on an interlayer insulating film(31). A metal layer(35) is formed on the lower anti-reflective film. An upper anti-reflective film is formed on the metal layer. The interlayer insulating film is etched to form a bare fuse. Passivation films(45, 47) are formed on the surface of the bare fuse. The upper and the lower anti-reflective films contain one selected from a group including Ti, Ti/TiN, or TiN.
申请公布号 KR20110001803(A) 申请公布日期 2011.01.06
申请号 KR20090059508 申请日期 2009.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, KI SOO
分类号 H01L21/82;H01L23/62 主分类号 H01L21/82
代理机构 代理人
主权项
地址
您可能感兴趣的专利