| 摘要 |
<p>Provided is a test apparatus for testing a device to be tested, which is equipped with first and second terminal groups that have a plurality of drivers to output a signal to the device to be tested, a first common setting unit that commonly sets a delay amount of a signal outputted from the drivers in the first and second terminal groups, an inter-group adjustment unit makes a reference phase of a signal outputted from the plurality of the drivers in the first terminal group close to a reference phase of a signal outputted from the plurality of the drivers in the second terminal group in accordance with a set value of the delay amount set by the first common setting unit in the case where the reference phase is adjusted in the first terminal group and a set value of the delay amount set by the first common setting unit in the case where the reference phase is adjusted in the second terminal group.</p> |
