发明名称 SYSTEM AND METHOD FOR TESTING SIGNALS OF ELECTRONIC COMPONENTS
摘要 A method for testing signals of electronic components. The method sends a positioning command to a control computer through a switch, so as to drive a probe holder of a mechanical arm to position probes of the oscilloscope on a position of the electronic component. The method further receives measured data collected by the oscilloscope, and compares the measured data with preset standard values to determine if the measured data is acceptable.
申请公布号 US2010268498(A1) 申请公布日期 2010.10.21
申请号 US20090603666 申请日期 2009.10.22
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 LI SHEN-CHUN;HSU SHOU-KUO
分类号 G01R13/00;G06F19/00 主分类号 G01R13/00
代理机构 代理人
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