发明名称 |
EPITAXIAL SUBSTRATE, SEMICONDUCTOR ELEMENT STRUCTURE, AND PRODUCTION METHOD OF THE EPITAXIAL SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an epitaxial substrate having a small internal electric field and excellent flatness, and to provide a device using the substrate. <P>SOLUTION: The epitaxial substrate is obtained through steps of: preparing a sapphire single crystal base 1 having the inclination angle of the surface of the base 1 ranging from -25° to -15°, wherein the inclination angle of the surface of the base 1 with respect to an R-plane is defined in such a manner that the angle is in a positive value when the surface of the base 1 gets away from the C-plane and that the angle is in a negative when the surface of the base 1 approaches the C-plane; and depositing a substrate surface layer comprising Al<SB>x</SB>Ga<SB>1-x</SB>N (0<x≤1.0) with the a-axis direction almost parallel to the r-axis direction of the sapphire single crystal base 1 by a MOCVD method on the sapphire single crystal base 1. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010235318(A) |
申请公布日期 |
2010.10.21 |
申请号 |
JP20090081665 |
申请日期 |
2009.03.30 |
申请人 |
NGK INSULATORS LTD |
发明人 |
SUMIYA SHIGEAKI;KURAOKA YOSHITAKA;MIYOSHI MAKOTO;TANAKA MITSUHIRO |
分类号 |
C30B29/38;C23C16/34;H01L21/205;H01L33/28 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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