发明名称 CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 Provided is a chemical mechanical polishing (CMP) apparatus. The CMP apparatus may include a polishing pad including a plurality of concave regions. These concave regions may be two-dimensionally arranged in the polishing pad in a first direction and a second direction that are not perpendicular to each other and not parallel to each other. The concave regions arranged in the first direction may have a first pitch, and the concave regions arranged in the second direction may have a second pitch equal to the first pitch.
申请公布号 US2010216378(A1) 申请公布日期 2010.08.26
申请号 US20100701893 申请日期 2010.02.08
申请人 CHOI JAEKWANG;JEONG JIN-SU;HONG MYUNG-KI;YOON BOUN 发明人 CHOI JAEKWANG;JEONG JIN-SU;HONG MYUNG-KI;YOON BOUN
分类号 B24D11/00;B24B7/20;B24B53/02 主分类号 B24D11/00
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