发明名称 Semiconductor device with multi-trench separation region
摘要 A semiconductor device is configured that a high-withstand voltage semiconductor device and logic circuits are integrated on a single chip and that a high-withstand voltage high-potential island including the high-potential-side logic circuit is separated using multiple partition walls enclosing therearound. The semiconductor device is provided with a multi-trench separation region having a level shift wire region that is used to connect the high-potential-side logic circuit to the high-potential-side electrode of the high-withstand voltage semiconductor device.
申请公布号 US7763950(B2) 申请公布日期 2010.07.27
申请号 US20090489841 申请日期 2009.06.23
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHIMIZU KAZUHIRO
分类号 H01L27/06 主分类号 H01L27/06
代理机构 代理人
主权项
地址