发明名称 Method for crystallization of amorphous silicon layer using excimer laser
摘要 A method of forming a polycrystalline semiconductor layer includes forming a semiconductor layer of amorphous silicon on a substrate, forming a plurality of spot seeds in the semiconductor layer by irradiating a first laser beam through a crystallization mask, each of the plurality of spot seeds being equally spaced from one another and each having equal area, and forming a polycrystalline silicon layer along an entire surface of the substrate by irradiating a second laser beam onto the semiconductor layer.
申请公布号 KR100971951(B1) 申请公布日期 2010.07.23
申请号 KR20030064455 申请日期 2003.09.17
申请人 发明人
分类号 G02F1/13;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 G02F1/13
代理机构 代理人
主权项
地址